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| Paper: |
Quantum efficiency measurements of Tektronix backside thinned CCDs |
| Volume: |
8, CCDs in Astronomy |
| Page: |
269 |
| Authors: |
Delamere, Alan; Atkinson, Mike; Rice, James P.; Blouke, Morley; Reed, Richard |
| Abstract: |
Results are presented of a program in progress to produce CCDs with high stable quantum efficiency (QE). Measurements made at 253.7 nm over a six-month period showed no significant QE difference between two CCDs manufactured in 1989 and one manufactured in 1988. QE improvement by the addition of a two-layer antireflection coating is about threefold at 400 nm. |
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