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Paper: Quantum efficiency measurements of Tektronix backside thinned CCDs
Volume: 8, CCDs in Astronomy
Page: 269
Authors: Delamere, Alan; Atkinson, Mike; Rice, James P.; Blouke, Morley; Reed, Richard
Abstract: Results are presented of a program in progress to produce CCDs with high stable quantum efficiency (QE). Measurements made at 253.7 nm over a six-month period showed no significant QE difference between two CCDs manufactured in 1989 and one manufactured in 1988. QE improvement by the addition of a two-layer antireflection coating is about threefold at 400 nm.
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